Matec Micro Electronics has designed an ultrasonic precision
scanning system capable of testing at high frequencies and at high speeds to
produce high-resolution images. This ultrasonic scanner is equipped to inspect
microelectronic components and parts that require micron size defect detection.
Along with the high-resolution images and analysis Windows? software package,
MME offers a complete digital data acquisition solution for your inspection
needs.
MI-SCAN System Features
Linear Servo Motor Drives on Scan and Step Axes
0.1 Micron Linear Encoder on Scan and Step Axes, Close
Loop Operation
Immersion Tank Large Enough for Two JEDEC Trays
Pulse Echo and Through Transmission Inspection
Capable of Detecting Flaws as Small as 5 microns
Fully Digital Data Acquisition System
Windows Software (MI-Scan IC)
Ultrasonic Inspection Range 5 - 300 MHz
1-4 GHz A/D Digitizer
System Enclosure with Safety Features
Immersion Tank Pump & Filter
Scan, Step and Focus Jog Controls
JEDEC Tray & Scan Platform Fixtures
Computer Workstation
One Year System Warranty
Manual Production or FA Lab Use
System Applications
The MI-SCAN is a universal system that can be utilized
in the FA Lab or as a Manual Production System. Inspection capabilities range
from a variety of IC Plastic Packages, BGA’s, Flip Chips, Ceramic Capacitors,
Smart Cards, Flex Circuits, Circuit Boards, Wafers and any other parts requiring
high speed, high frequency precision ultrasonic inspection. Both pulse echo
or through transmission inspections can be performed where applicable.
The system can detect delaminations, die attach,
die tilt, die cracks, popcorn cracks, package voids, solder ball joints, underfill
delaminations, cracks, voids, bonded wafer voids, surface mount cracks, heat
sink attach and many other defects.
Hardware
Specification
Motorized Axes
3 Axes: (Scan, Step & Focus), Linear Servomotors
with linear encoders (0.1 micron resolution) on Scan and Step axes. Precision
lead screw on the Focus axis.
Scan & Step Resolution:
0.1 micron
Scan & Step Repeatability:
+/- 0.1 micron
Scan Speed:
1000 mm/sec. (40"/sec.)
Immersion Tank Size:
Acrylic tank, 457mm (18") long x 457mm (18")
wide x 152mm (6") deep
Stability:
Solid aluminum anodized base with anti-vibration
pads.
JEDEC Tray Fixture
Single Tray standard, Dual Tray optional
Limit Switches:
Limit switches on all axes
Through Transmission Fixture:
Optional: 10 or 20 MHz Transducers (receiving wand)
Scanner Cover:
System enclosure with safety features
Water Pump & Filter:
Water pump and 30-micron filtration
Data Acquisition Hardware
Specification
DPR-500 Pulser Receiver:
300 MHz Bandwidth
AL1G, A/D Digitizer:
Up to 4 GHz
Motion Control Hardware
Specification
Galil
Motion Control Card
Trilogy Linear Servos
Linear Servo Motor Drives
Renishaw Linear Scales
Linear Encoders
COMPUTER
1 GHz Pentium Processor
40 GB Hard Drive
512 MB RAM
32X Read/Write CD-ROM Drive
3.5" High Density Floppy Drive
17" SVGA Color Monitor
101-Key Keyboard
2 Button Mouse, Mouse Pad
Windows Software installed and pre-configured
Computer Workstation
HP DeskJet 990Cse Color Printer
Surge-Suppressor Multi Outlet Power Strip
SUPPLY POWER
110vac 20 amp.
or
220vac 10 amp.
SOFTWARE
MI-SCAN IC Software
Features:
Windows-Platform Software
A, B & C-Scan Imaging
Multiple Data Gates: Peak Amplitude, Time-of-Flight,
Phase Inversion Analysis, FFT Analysis, and Multi-Layer Gating
Single Chip or JEDEC Tray Inspection
Software, Keyboard Jog Controls
Mouse-to-Screen Transducer Location Control (MTS)
RF Waveform Collection
Multi-Layer Imaging
Auto Analysis
3 D Imaging
Motion Control Scan Setup Menu
Auto Part Sizing and Centering
On-Screen Measurement Tools
Multiple Templates
Gray-Scale or Full-Color Palette Editor
Image Flaw Detection Analysis
Continuous Image Zoom and Pan
Image Histogram Display
Image Processing Filters
Motion Control Scanning Software Included:
Chip Scan (one package)
Link Scan (more than one package includes trays)
Multi-Layer Package Scan
JADEC Tray Scan (full tray scan)
JADEC Tray Jump Scan (more than one package on a tray)
Multi-Focus Scan (multiple scans at varying focal depths)
