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MME MI-SCAN IC™ Software
 Matec
Micro Electronic provides a new Windows based scanning acoustic
microscope software package complete with digital data acquisition
and analysis with integrated 1 GHz A/D digitizer and 300 MHz Pulser
Receiver, it offers state-of-the-art SAM capability. Unmatched by
any other SAM, the Mi-Scan IC software collects and displays data
in a more precise way made possible by its unique “Pulse-on-Position”
data collection technique. The fully integrated database makes storing
and sorting scan data easy and efficient.
Inherent Windows Benefits:
- Ease of Operation
- Graphical User Interface
- Network Interface
- Printer Library
- Multi-Tasking
- (Simultaneous Post Analysis of Data and Scanning New Part)
- Universal File Format (TIFF, etc.)
Features:
- Windows Platform Software
- A, B & C-Scan Imaging
- High Speed Data Acquisition at High Image Resolution
- Multiple Data Gates: Peak Amplitude, Time-of-Flight, Phase
Inversion Analysis,
FFT Analysis, and Multi-Layer Gating
- Single Chip or JEDEC Tray Inspection
- Software and Keyboard Jog Controls
- RF Waveform Collection
- Image Flaw Automatic Analysis
- Motion Control Scan Setup Menu
- Save and Recall Image and Instrument Parameter Set-Up Files
- On-Screen Measurement Tools
- Multiple Templates
- Gray Scale or Full Color Palette Editor
- Image Flaw Detection Analysis
- Continuous Image Zoom and Pan
- Image Histogram Display
- Image Processing Filters
- Image Annotation
- User Level Log-On
Inspection Scanning Selections:
- Chip Scan - Single Package Scan (C-Scan)
- Link Scan - Multi-Package Scan (C-Scan)
- JEDEC Tray Scan (C-Scan)
- JEDEC Tray Jump Scan (more than one package on a tray)
- Multi-Focus Scan (multiple scans at varying focal depths)
- Multi-Layer Package Scan (C-Scan)
- Thru-Transmission Scan
- RF Waveform Collection (B-Scan)
- Auto Part Sizing and Centering
- Software and Keyboard Jog Controls
- Mouse-to-Screen (MTS) Transducer Location Control
Advanced Image Analysis and Processing:
- Gray-Scale or Full-Color Palettes Editor
- Image Flaw Detection Analysis and Characterization
- Histogram Display
- Image Processing Filters
- On-Screen Measurement Tools
- Cross Section Analysis Tool
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