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APS-100: Total Particle Size Analysis
Perform detailed, absolute particle
size analysis
and more...without dilution!
 Finally,
you don't have to settle for dilute Particle Size Data. The APS
performs measurements on undiluted and/or opaque samples!
Better yet, unlike other particle size analyzers, you don't have
to know a priori - or guess - the shape of your sample's Particle
Size Distribution (PSD). Matec Applied Sciences and Lucent Technologies
bring you the APS-100.
The APS produces undiluted PSD data simultaneously with acoustic
attenuation and sound speed spectra, percent solids, pH, conductivity,
and temperature.
Call on the particle size and Zeta potential analysis leader for
the last twenty years, Matec Applied Sciences. Our knowledgeable staff
will gladly perform FREE sample analyses for evaluation;
or if you prefer, we will visit you for an on-site demonstration.
How
it works
The APS produces PSD data from acoustic attenuation spectroscopy
measurements without the need for sample dilution. The APS
also measures sound speed spectra, pH, conductivity, and temperature
of samples in the particle size range of 10 nm to 100 microns.
As sound travels through a slurry or colloid, it is attenuated.
The level of attenuation is related to the particle size distribution.
The APS measures acoustic attenuation very accurately over
the 1-100 MHz frequency range. Because sound travels through
all material media, APS acoustic attenuation measurements
can be made on high-concentration and/or opaque samples. Particle
settling is not a problem since samples can be stirred or
pumped during the measurement. APS analysis is independent
of the sample's Zeta potential level. The APS readily analyzes
particles of zero, as well as, high electric charge.
APS sample analysis is quick and easy without requiring sample
dilution, which is time consuming, error prone, and may alter
the sample's actual PSD. Simply pour, or continuously pump
your sample into the APS sample cell and the APS’ intuitive
software
does the rest in minutes.
The APS uses software developed and patented by Lucent
Technologies to calculate detailed PSD data without the need
for assumptions regarding the PSD shape . Other ensemble-type
instruments, e.g., light-scattering, require that either the
software or the operator assume or guess whether the PSD is
unimodal, bimodal, lognormal or Gaussian. Such assumptions
may render the data unreliable.
The patented APS hardware design simplifies
operation while minimizing maintenance. This design is thus
suitable for R&D, as well as, repetitive QC measurements.
The APS is also suitable for process online operation. |
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Applications
The APS can be used in a wide range
of R&D, as well as industrial production environments.
Typical applications include:
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Semiconductor
Chemical Mechanical Polishing (CMP) slurries
Detect wafer-scratching oversized particles directly, or determine
the slurry's actual, detailed PDS
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Ceramics
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Inks
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Emulsion
stability,
O/W and W/O
Measure additive effects
easily.
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Pharmaceuticals
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Biocolloids
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Light
Phosphors
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Organic
and Inorganic Pigments such as Ti02 and Carbon Black
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Catalysts
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Minerals
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Polymer
Latex
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Aqueous
and Non-aqueous Dispersions
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Software
The APS software incorporates twenty years of instrument design
experience. Perform a particle size analysis with a simple mouse
click. Powerful graphics allow you to compare data directly. The
APS data files can be readily imported into popular spreadsheet
software for further analysis.
The APS can be used in repetitive QC analysis settings without
requiring highly trained operators. Additionally, advanced research
can be conducted thanks to the powerful data analysis capabilities.
PSD computations are performed by patented software from Lucent
Technologies. No assumptions are required regarding the shape of
the PSD. The resulting PSD data is detailed and absolute since there
is no need for calibration with particle size standards.
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The figure to the left shows APS
PSD overlaid plots from three silica samples (same total percent
solids).
The green and red curves represent blends of 60 nm and 300
nm silica samples. The APS data accurately reflects the different
60/300 nm particle ratios. The yellow curve corresponds to
a 300 nm sample
by itself.
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The figure to the right presents
the acoustic attenuation data,
in dB/cm vs. Frequency (MHz),
for these three samples. As the
ratio of 300 nm to 60 nm
particles increases, the shape
of the attenuation curve
changes, while the
attenuation level increases. |
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